UCSD VLSI CAD LABORATORY
DAC 1999 Panels Slides
Andrew B. Kahng, "Sub-Wavelength Litho and EDA: Panel Context"
Lance Glasser, "How do defects and defect inspection affect you"
Warren D. Grobman, "Some New EDA Tool Domains & Issues for
Design Integrity in the Deep Sub-Micron Era"
Mark Lavin, "Sub-Wavelength Lithography: How will it affect
your Design flow?"
Robert C. Pack, Sub-Wavelength Lithography: How Will it
Impact Your Design Flow?"
Kenneth V. Rousseau, "Panel Discussion on PSM/OPC Effect:
Influence on Library Development"
Questions